With the continuous development of technology, chip testing has become an indispensable part of many industries. As an important tool for chip detection, X-ray detection equipment is increasingly receiving people's attention.

X-ray flaw detection is a nondestructive testing method to find defects by using X-ray's ability to penetrate material and have attenuation in material.

X-ray flaw detection is a nondestructive testing method to find defects by using X-ray's ability to penetrate material and have attenuation in material.