X-ray Fluorescence Spectrometer

Using energy dispersive X-ray fluorescence analysis technology,Xrf spectrometer AL-NP-5010A is capable of measuring various elements in the substance simultaneously. The Xrf metal analyzer can be configured to measure any multiple elements from Na to U according to the user'sapplication requirements. The edxrf Spectrometer can be widely used in the environmentalprotection, archaeology, building materials, RoHS directive and other industries. Edxrf Spectrometer is the ideal choice of quality control for the enterprise.

The wavelength dispersive X-ray fluorescence spectrometer (WDXRF) is a high-tech product developed by our company based on the experience and fruits of domestic R&D on similar instrument over years, and absorbing the international advanced technology, The technical performance indexes have reached the level ofinternational similar products.
The xrf analyzer is also used in universities and researchinstitutes.

The X-ray fluorescence coating thickness gauge is an analytical instrument that uses energy dispersive X-ray fluorescence analysis technology to simultaneously measure multiple elements. It can be configured to analyze and determine any number of elements from Na to U according to user application requirements.

Using Portable X-ray fluorescence Xrf analysis technology, The X-ray fluorescence is capable of measuring various elements in the substance simultaneously. The portable xrf can be configured to measure any multiple elements from Na to U according to the user's application requirements. The xrf analysis can be widely used in the environmental protection, archaeology, building materials, RoHS directive and other industries. The portable xrf is the ideal choice of quality control for the enterprise.

The wavelength dispersive X-ray fluorescence analyzer is a high-tech product developed by our company, which summarizes the experience and lessons learned from the development of this type of instrument in China over the years, and absorbs and references advanced international technologies. Through in-depth industrial research and development, all technical performance indicators have reached the level of similar international products.

X-ray fluorescence spectrometer (XRF) is a state-of-art universal analysis method for elemental determination of various materials.
XRF analizador is characterized by simple sample preparation, wide range of measurement elements，high accuracy, good reproducibility,fast measuring speed (30s to 900s), no environmental pollution and no damage to samples.