x-ray fluorescence spectrometer

The X-ray fluorescence coating thickness gauge is an analytical instrument that uses energy dispersive X-ray fluorescence analysis technology to simultaneously measure multiple elements. It can be configured to analyze and determine any number of elements from Na to U according to user application requirements.

The wavelength dispersive X-ray fluorescence analyzer is a high-tech product developed by our company, which summarizes the experience and lessons learned from the development of this type of instrument in China over the years, and absorbs and references advanced international technologies. Through in-depth industrial research and development, all technical performance indicators have reached the level of similar international products.

X-ray fluorescence spectrometer (XRF) is a state-of-art universal analysis method for elemental determination of various materials. XRF analizador is characterized by simple sample preparation, wide range of measurement elements，high accuracy, good reproducibility,fast measuring speed (30s to 900s), no environmental pollution and no damage to samples.