Desktop 2D X-ray diffractometer

  • Desktop 2D X-ray diffractometer
Desktop 2D X-ray diffractometer
  • Aolong
  • Dandong
  • within 15 days
  • 50pcs one month

The AL-Y500 diffractometer is the latest desktop two-dimensional X-ray diffractometer launched by Aolong Group. It uses a fixed detector for photography, which is different from traditional scanning diffractometers. The X-ray array photon counting semiconductor detector has point, line, and plane 0D, 1D, and 2D compatibility modes;

X-ray Diffractometer

Mainly used for phase qualitative and quantitative analysis of polycrystalline samples, including standard free quantitative analysis, crystallinity determination, crystal structure analysis, material structure analysis, grain size determination, structural refinement, micro area analysis, thin film and texture stress analysis, etc. Suitable for various fields and industries such as minerals, pharmaceuticals, chemicals, metals and alloys, building materials, nanomaterials, batteries, food samples, biological samples, etc.


Instrument features:


Fixed detector photography, different from traditional scanning diffractometers, the photography mode is efficient and fast, about 5-30 times faster than the scanning mode, suitable for in-situ analysis, and collecting diffraction information from different angles at the same time; High energy resolution, effectively reducing fluorescence background.


● Angle measuring instrument θ S θ D-arm adopts servo motor drive and optical coding control technology, and the detector can be driven along 2 θ By moving the axis in two positions, the goniometer rotates more smoothly, the diffraction angle measurement is more accurate, and the linearity is better. Sample edge θ Axis rotation, control accuracy 0.01 °, 2 θ Axis angle accuracy ± 0.02 °.


● Configure multiple detector units to form detector components, uniformly and fixedly distributed along the diffraction circle, and seamlessly cover all angles; Double layer 21 piece (or single layer 10 piece) array detector, covering 2 θ Range: -3 °~150 °, 2D imaging, simultaneous collection γ Angle information and two-dimensional diffraction data provide richer information.


X-ray array photon counting semiconductor detector, highly sensitive, capable of single photon counting, large dynamic range, dual threshold; Interchange of point and line light sources, dual optical geometry between Debye Scheler and BB, compatible with planar and cylindrical samples, and compatible with detector 2D, 1D, and OD modes. And it is resistant to long-term exposure to strong radiation, with a long service life.


The radiation protection device is safer and more reliable. During sample measurement, the radiation protection door automatically prohibits opening, which can prevent operators from being exposed to scattered radiation under any circumstances.


The compact size can be installed on the experimental platform without the need for a specific laboratory environment, making it easy to use, operate, and maintain.


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