Desktop X-ray diffractometer
- Aolong
- Dandong
- within 15 days
- 500pcs one month
Designed for industrial production and quality control, this advanced technology is used to concentrate the production of X-ray diffractors. It is a functional and miniaturized desktop X-ray diffractometer. Capable of accurately conducting qualitative, quantitative, and crystal structure analysis on both metallic and non-metallic samples. Especially suitable for the manufacturing industries of catalysts, titanium dioxide, cement, pharmaceuticals, and other products.
Main technical indicators:
● Operating power (tube voltage, tube current): 600W (40kV, 15mA) or 1200W (40kV, 30mA), stability: 0.005%
● X-ray tube: metal ceramic X-ray tube, Cu target, power 2.4kW, focal size: 1x10 mm
● Air or water cooling (water flow rate greater than 2.5L/min)
● Goniometer: sample level θ S- θ D structure, diffraction circle radius 150mm
● Sample measurement method: continuous, step-by-step, Omg
● Angle measurement range: θ S/ θ When linked, -3 ° -150 °
● Minimum step width: 0.0001 °
● Angle reproduction: 0.0005 °
● Angle positioning speed: 1500 °/min
● Counter: Closed proportional or high-speed one-dimensional semiconductor counter
● Spectral resolution: less than 25%
● Maximum linear counting rate: ≥ 5 × 105CPS (proportional), ≥ 9 × 107CPS (one-dimensional semiconductor)
● Computer: Dell Business Notebook
● Instrument control software: Windows 7 operating system, automatically controls the tube voltage, tube current, shutter, and aging training of the X-ray generator; Control the goniometer to continuously or step scan while collecting diffraction data; Routine processing of diffraction data includes automatic peak finding, manual peak finding, integration intensity, peak height, center of gravity, background subtraction, smoothing, peak shape amplification, spectral comparison, etc.
●Data processing software: qualitative and quantitative analysis of phases, K α 1 α 2. Functions such as peeling, full spectrum fitting, peak selection fitting, half width and grain size calculation, crystal cell determination, second-class stress calculation, diffraction line indexing, multiple plotting, 3D plotting, diffraction data calibration, background subtraction, standard free quantitative analysis, full spectrum fitting (WPF), XRD diffraction spectrum simulation.
● Scattering ray protection: lead+lead glass protection, interlocking of shutter window and protective device, scattering line measurement not exceeding 1 μ Sv/h
●Instrument comprehensive stability: ≤ 1 ‰
● Sample loading data at once: Configure a sampler to load up to 6 samples at a time
●Instrument dimensions: 600 x 410 x 670 (w x d x h) mm
